Specifications
Test Parameter : |Z|, |Y|, C, L, X, B, R, G, D, Q, Theta
DCR, Turn-Ratio, Phase
Test Frequency :
20 Hz to 300 KHz ,Resolution:10mHz,
Accuracy:0.01%
Test Level Range :
Normal: 5mV to 2V, Turn-Ratio: 5mV to 4V
Resolution:1mV, Accuracy:5%
Output impedance :
Turn-Ratio <=2Vrms:10 Ohm ; >2Vrms:30 Ohm
Others 30 Ohm and100 Ohm selectable
Basic accuracy : 0.05%
Measuring Time (>= 1KHz) : Fast :32ms, Med: 90ms, Slow:650 ms
Equivalents Circuit : Series and Parallel
Ranging Mode : Auto and Hold
Trigger Mode : Internal,Manual and External
Averaging Rate : 1 - 255
Correction Function : Open, Short and Load
Internal DC bias source : 0V, 1.5V, 2V, Accuracy:1%
Comparator function : 10 bins and bin couters
Memory : 20 groups of control setting can be saved
DCR, Turn-Ratio, Phase
Test Frequency :
20 Hz to 300 KHz ,Resolution:10mHz,
Accuracy:0.01%
Test Level Range :
Normal: 5mV to 2V, Turn-Ratio: 5mV to 4V
Resolution:1mV, Accuracy:5%
Output impedance :
Turn-Ratio <=2Vrms:10 Ohm ; >2Vrms:30 Ohm
Others 30 Ohm and100 Ohm selectable
Basic accuracy : 0.05%
Measuring Time (>= 1KHz) : Fast :32ms, Med: 90ms, Slow:650 ms
Equivalents Circuit : Series and Parallel
Ranging Mode : Auto and Hold
Trigger Mode : Internal,Manual and External
Averaging Rate : 1 - 255
Correction Function : Open, Short and Load
Internal DC bias source : 0V, 1.5V, 2V, Accuracy:1%
Comparator function : 10 bins and bin couters
Memory : 20 groups of control setting can be saved